Profile

    Zhi Ye was born in Hunan, China, in 1982. He received the B.S. degree in measurement and control technology and instrument and the M.S. degree in mircroelectronic technology from Xiangtan University, Hunan, China, in 2004 and 2007, respectively, and Ph.D degree in electronic and computer engineering from the Hong Kong University of Science and Technology, Kowloon, Hong Kong, in 2012.
    His research interests include ZnO-based thin-film transistor structure, methods of fabrication, and ferroelectric thin-film memory.

Research work

Metal oxide thin film transistor structure, process and application.

Contact

Phone:15868880640
E-mail:yezhi@zju.edu.cn