1. Research of the atomic force microscopy profilometer system

  2. A novel atomic force microscope with high stability and scan speed

  3. AFM in liquid and on-spot study of metal corrosion

  4. A novel atomic force microscope with high stability and scan speed

  5. Full-field quantitative phase imaging by white-light interferometry with active phase stabilization and its application to biological samples

  6. Dual imaging-unit atomic force microscope for nanometer order length metrology based on reference scales

  7. Dual tunneling-unit scanning tunneling microscope for practical length measurement based on

  8. Dual tunneling-unit scanning tunneling microscope for practical length measurement based on reference scales

  9. Dual unit scanning tunneling microscope-atomic for

  10. Dual imaging-unit atomic force microscope for nanometer order length metrology based on reference scales

  11. Electrochemical Microprocess by Scanning Ion-Condu

  12. Dual Unit Scanning Tunneling Microscope Atomic-For

  13. A Horizontal atomic force microscope and its applications

  14. A novel atomic force microscope operating in liquid for in situ investigation of electrochemical preparation of porous alumina

  15. Calibration of non-linearity of piezo elements and image distortion in atomic force microscope

  16. Laser gap sensor used in electrostatic suspension system with optoelectronic feedback control

  17. A wide-range metrology AFM and its applications

  18. Dual imaging-unit atomic force microscope and its application in nanometer order length metrolegy

  19. Atomic force microscope and anti-corrosion processing of porous alumina

  20. Characteristics of PSD233 position sensitive detector and its application in atomic force microscope

  21. Micro impact drive motor driven by piezo element

  22. Atomic force microscope study of mechanism of micro photo-thermal expansion

  23. Wide-range scanner with hinge mechanism and its application in atomic force microscope

  24. Theoretical and experimental study of photo-thermal expansion using an atomic force microscope

  25. Study of nanostructures and reflective spectra of porous alumina films

  26. In-situ thickness measurement of porous alumina by atomic force microscopy and the reflectance wavelength measurement from 400-1000 nm

  27. Full-field quantitative phase imaging by white-light interferometry with active phase stabilization and its application to biological samples

  28. Theoretical and experimental study of photo-thermal expansion using an atomic force microscope

  29. 液相原子力显微镜技术及系统

    二等,20071108,
  30. 利用原子力显微镜的光热膨胀的理论和实验研究(英文)

    二等,20071008,
  31. 卧式原子力显微镜技术及系统

    三等,20061205,
  32. 液相原子力显微镜技术及系统

    一等,20061008,
  33. 液相原子力显微镜技术及系统

    特等,2006-12-25 00:00:00.,
  34. 卧式原子力显微镜技术及系统

    二等,2006-12-01 00:00:00.,
  35. On-spot evaluation of maturity stage of fruits based on 655 nm laser-induced photoluminescence of chlorphyll-a

    2006-10-16 00:00:00.,
  36. 3Dmicrostructure manufacture based on laser-induced thermoplastic expansion

    2006-10-16 00:00:00.,
  37. Analysis and experimentation of novel bi-directional photo-thermal micro-actuators

    2006-10-16 00:00:00.,
  38. A Novel Atomic Force Microscope with High Stability and Scan Speed

    2006-10-12 00:00:00.,
  39. Study of 660 nm Laser-Induced Photoluminescence of Chlorophyll-a and Its Applications

    2006-08-18 00:00:00.,
  40. In-Situ Thickness Measurement System for Porous Alumina Film Based on AFM and Spectrometer

    2006-08-18 00:00:00.,
  41. 原子力显微术轮廓仪系统的研究

    2006-07-13 00:00:00.,
  42. 液相型AFM的研制与金属腐蚀原位研究

    2006-05-15 00:00:00.,
  43. In-situ thickness measurement of porous alumina by atomic force microscopy and the reflectance wavelength measurement from 400-1000 nm

    2006-04-15 00:00:00.,
  44. 纳米多孔氧化铝薄膜厚度的反射光谱测量方法研究

    2006-04-13 00:00:00.,
  45. 多孔氧化铝薄膜的纳米结构和光谱特性研究

    2006-03-15 00:00:00.,
  46. 多孔氧化铝薄膜的纳米结构和光谱特性研究

    2006-03-15 00:00:00.,
  47. 花旗集团教育基金项目奖教金

    二等,20051101,
  48. 基于多孔氧化铝的大范围尺度计量用双元原子力显微镜(英文)

    二等,20051008,
  49. 双成像单元原子力显微镜及其在大范围纳米计量中的应用

    2005-10-01 00:00:00.,
  50. 基于原子力显微镜的薄膜厚度检测系统

    2005-10-01 00:00:00.,
  51. Theoretical and experimental study of photo-thermal expansion using atomic force microscope.

    2005-09-01 00:00:00.,
  52. 基于AFM的微位移测量新方法研究

    2005-08-01 00:00:00.,
  53. 液相原子力显微镜系统

    2005-06-22 00:00:00.,
  54. 卧式原子力显微镜系统

    2005-06-22 00:00:00.,
  55. Atomic force microscope in liquid with a specially designed probe for practical application.

    2005-05-01 00:00:00.,
  56. AFM纳米加工系统设计

    2005-02-01 00:00:00.,
  57. A novel atomic force microscope operating in liquid for in-situ investigation of electrochemical preparation of porous alumina.

    2005-02-01 00:00:00.,
  58. In-situ study of corrosion with an atomic force microscope scanning in liquids.

    2005-02-01 00:00:00.,
  59. A Horizontal atomic force microscope and its applications.

    2005-02-01 00:00:00.,
  60. 新型冲击驱动器及其在扫描隧道显微镜中的应用

    2005-02-01 00:00:00.,
  61. A wide-range metrology AFM and its applications.

    2005-02-01 00:00:00.,
  62. 新型原子力显微镜的研制及其应用

    三等,20031008,
  63. 浙江大学优秀工作者

    20020910,
  64. 浙江省“151人才”第二层次

    20001208,
  65. 双元扫描隧道显微镜—原子力显微镜及原子尺纳米计量技术

    一等,20000110,